Solving a long-standing problem in transmission electron microscopy

For researchers wanting to understand the inner workings of magnetic materials, transmission electron microscopy is an indispensable tool. Because the wavelength of an electron is much shorter than the wavelength of visible light, a beam of electrons transmitted through a thin slice of a material can create an image in which the inner structure of the material is magnified up to 50 million times, many orders of magnitude more than with an optical microscope.